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N-type - YSG210-Res0.4-A

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Monocrystalline Silicon Wafers

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Technical Characteristics

  • 0.4-1.1

    Resistivity

  • 70

    Minority Carrier Lifetime

  • 500

    Dislocation Density

  • Ga

    Doped Elements

  • N-type - YSG210-Res0.4-A Monocrystalline Silicon Wafers

    It's a tradition, but also a leader for the future

    Ultra high efficiency | Stable and reliable | Extremely low attenuation | Excellent conductivity

    • Multiple independent patented technologies
    • Single-line production capacity greatly enhanced
    • Energy and material consumption has been significantly reduced
    • Industry-leading quality standards

    Product Parameters

    Geometric dimensions and surface properties

    Product Model YSG210
    Geometric Shape All aspects
    Chamfer Edge Shape Arc
    Wafer Edge Distance 210±0.25 mm Measured by wafer automatic inspection equipment
    Silicon Wafer Diameter φ295±0.25 mm Measured by wafer automatic inspection equipment
    Verticality 90±0.15° Measured by wafer automatic inspection equipment
    Thickness 155±10 um or 150±10 um Measured by wafer automatic inspection equipment
    Batch Thickness ≥155 um or ≥150 um Measured by wafer automatic inspection equipment
    TTV (Total Thickness Variation) ≤25 um Measured by wafer automatic inspection equipment
    Line Mark ≤15 um Measured by wafer automatic inspection equipment
    Bending Degree ≤40 um Measured by wafer automatic inspection equipment
    Warpage Degree ≤40 um Measured by wafer automatic inspection equipment
    Cutting Method Diamond wire cutting
    Surface Quality Surface Quality
    (no oil stains, fingerprints, spots, mortar residue, glue residue)
    Verified by wafer automatic inspection equipment
    Edge Chipping Depth ≤ 0.3 mm & length ≤ 0.5 mm, no more than 1 per wafer, no V-shaped edge chipping Inspected manually or by wafer automatic inspection equipment
    Cracks and Air Holes Not allowed Measured by wafer automatic inspection equipment
    Product Information Download

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